PAUT and TFM inspection speeded up with last M2M Capture release

Les Ulis, France, December 20, 2018 —Eddyfi Technologies is proud to announce the latest release of M2M Capture. Natively embedded on both M2M Gekko and M2M Mantis PAUT flaw detectors, Capture v2.3 offers new advanced features and dedicated tools to improve the user experience and speed up NDT inspection. Released twice a year, Capture software is an evolutive platform combining state-of-the art technologies and highly intuitive interface
Source: NDT