Nanotronics, the inventor of a platform that combines AI, automation, and sophisticated imaging for industrial inspection, has announced that Vadim Pinskiy, VP of R&D at the Brooklyn-based manufacturing and microscopy company, presented at the upcoming O’Reilly Artificial Intelligence Conference which took place in San Jose from Sept. 9 to 12.

Vadim’s session, “Development and application of advanced AI decision making for manufacturing” focused on the theory and development of an AI model for robust r
Source: NDT