Les Ulis, France, June 19th, 2019 — Eddyfi Technologies is proud to announce the release of the new generation of M2M Gekko, the state-of-the-art phased array flaw detector.

Launched in December 2013, the first Gekko generation has brought a wind of change to the NDT market by offering embedded real-time TFM in addition to beam-forming phased array and conventional UT technology through a modern intuitive software interface.

Built on the strength of its predecessor, the new Gekko generation benefits
Source: NDT