#ndt Hamburg, May 8, 2017: This year’s trade-fair presentation from YXLON is going to revolve primarily around the topic of metrology using computed tomography. The main attraction: a new version of the CT systems YXLON FF20 CT and YXLON FF35 CT will be presented that is targeted to appeal to metrologists.

The advantage of CT systems in measurement technology is that, unlike optical and tactile methods, inner structures and material boundary surfaces can be measured with extremely accurate precision as well.
Source: NDT