#ndt Acoustic imaging of high-voltage ceramic chip capacitors performs a non-destructive cross section through the capacitor—or, since the method is non-destructive, as many cross sections as desired. All of the imaging modes have the same purpose: to prevent flawed capacitors from causing field failures.

Within the body of a high-voltage multi-layer ceramic capacitor, a gap-type defect is beginning its career of destruction. The defect may be a void within the ceramic dielectric, a crack within the d
Source: NDT