{"id":12766,"date":"2017-02-20T20:48:00","date_gmt":"2017-02-20T20:48:00","guid":{"rendered":"https:\/\/iesinspection.com\/sonoscan-introduces-j610-large-area-c-scan-tool-for-production-floor\/"},"modified":"2017-02-20T20:48:00","modified_gmt":"2017-02-20T20:48:00","slug":"sonoscan-introduces-j610-large-area-c-scan-tool-for-production-floor","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=12766","title":{"rendered":"Sonoscan Introduces J610 Large Area C-Scan Tool for Production Floor"},"content":{"rendered":"<p>#ndt Sonoscan has introduced the J610\u2122, the latest member of its C-SAM acoustic microscope line.  The J610 is a semi-automated tool designed for production environments and has an unusually large scan area. Its key role is finding internal structural defects by screening trays of loose components, wafers, board-mounted components and other suitably sized items.<\/p>\n<p>The 610mm x 610mm scan area can accommodate 6 JEDEC-style trays or one or more printed circuit boards. To reduce vibrations and maximize image quality<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt Sonoscan has introduced the J610\u2122, the latest member of its C-SAM acoustic microscope line. The J610 is a semi-automated tool designed for production environments and has an unusually large scan area. Its key role is finding internal structural defects by screening trays of loose components, wafers, board-mounted components and other suitably sized items. The 610mm [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[38],"tags":[6],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/12766"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=12766"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/12766\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=12766"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=12766"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=12766"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}