{"id":13145,"date":"2017-12-19T13:25:00","date_gmt":"2017-12-19T13:25:00","guid":{"rendered":"https:\/\/iesinspection.com\/olympus-launches-lext-ols5000-3d-measuring-laser-microscope\/"},"modified":"2017-12-19T13:25:00","modified_gmt":"2017-12-19T13:25:00","slug":"olympus-launches-lext-ols5000-3d-measuring-laser-microscope","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13145","title":{"rendered":"Olympus Launches LEXT OLS5000 3D Measuring Laser Microscope"},"content":{"rendered":"<p>#ndt Olympus Corporation (President: Hiroyuki Sasa) is pleased to announce the simultaneous worldwide launch of the LEXT OLS5000 3D measuring laser microscope on October 18, 2017, as a new product from its Scientific Solutions business. The OLS5000 microscope is used in research and development and quality inspection in the automotive, electronic component and semiconductor industries.<\/p>\n<p>The OLS5000 3D measuring laser microscope scans laser light over the surface of a sample to provide enlarged images of micro-&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt Olympus Corporation (President: Hiroyuki Sasa) is pleased to announce the simultaneous worldwide launch of the LEXT OLS5000 3D measuring laser microscope on October 18, 2017, as a new product from its Scientific Solutions business. The OLS5000 microscope is used in research and development and quality inspection in the automotive, electronic component and semiconductor industries. The [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13145"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13145"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13145\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13145"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13145"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13145"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}