{"id":13197,"date":"2018-02-05T16:00:00","date_gmt":"2018-02-05T16:00:00","guid":{"rendered":"https:\/\/iesinspection.com\/defects-in-high-voltage-ceramic-capacitors-found-acoustically\/"},"modified":"2018-02-05T16:00:00","modified_gmt":"2018-02-05T16:00:00","slug":"defects-in-high-voltage-ceramic-capacitors-found-acoustically","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13197","title":{"rendered":"Defects in High-Voltage Ceramic Capacitors Found Acoustically"},"content":{"rendered":"<p>#ndt Acoustic imaging of high-voltage ceramic chip capacitors performs a non-destructive cross section through the capacitor\u2014or, since the method is non-destructive, as many cross sections as desired. All of the imaging modes have the same purpose: to prevent flawed capacitors from causing field failures.<\/p>\n<p \/>\n<p>\nWithin the body of a high-voltage multi-layer ceramic capacitor, a gap-type defect is beginning its career of destruction. The defect may be a void within the ceramic dielectric, a crack within the d&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt Acoustic imaging of high-voltage ceramic chip capacitors performs a non-destructive cross section through the capacitor\u2014or, since the method is non-destructive, as many cross sections as desired. All of the imaging modes have the same purpose: to prevent flawed capacitors from causing field failures. Within the body of a high-voltage multi-layer ceramic capacitor, a gap-type defect [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13197"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13197"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13197\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13197"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13197"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13197"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}