{"id":13252,"date":"2018-03-17T02:41:00","date_gmt":"2018-03-17T02:41:00","guid":{"rendered":"https:\/\/iesinspection.com\/on-semiconductor-introduces-highest-resolution-35mm-image-sensor-to-date\/"},"modified":"2018-03-17T02:41:00","modified_gmt":"2018-03-17T02:41:00","slug":"on-semiconductor-introduces-highest-resolution-35mm-image-sensor-to-date","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13252","title":{"rendered":"ON Semiconductor Introduces Highest Resolution 35mm Image Sensor to Date"},"content":{"rendered":"<p>#ndt ON Semiconductor (Nasdaq: ON), driving energy efficient innovations, is extending capabilities for critical high resolution industrial imaging with the introduction of a new 43 megapixel (MP) resolution, charge-coupled device (CCD) image sensor in the convenient 35 mm optical format. The KAI-43140 is ideal for use in applications where both very high resolution image capture and excellent image uniformity is required, such as end of line inspection of high-definition (HD) and ultra-high-definition (UHD) fla&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt ON Semiconductor (Nasdaq: ON), driving energy efficient innovations, is extending capabilities for critical high resolution industrial imaging with the introduction of a new 43 megapixel (MP) resolution, charge-coupled device (CCD) image sensor in the convenient 35 mm optical format. The KAI-43140 is ideal for use in applications where both very high resolution image capture and [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13252"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13252"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13252\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13252"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13252"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13252"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}