{"id":13426,"date":"2018-09-03T18:24:00","date_gmt":"2018-09-03T17:24:00","guid":{"rendered":"https:\/\/iesinspection.com\/rigaku-presents-latest-xrm-and-ct-technology\/"},"modified":"2018-09-03T18:24:00","modified_gmt":"2018-09-03T17:24:00","slug":"rigaku-presents-latest-xrm-and-ct-technology","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13426","title":{"rendered":"Rigaku Presents Latest XRM and CT Technology"},"content":{"rendered":"<p>#ndt X-ray analytical instrument manufacturer Rigaku Corporation is pleased to announce its attendance at the 14th International Conference on X-ray Microscopy (XRM2018), being held August 19-24, 2018 at the University of Saskatchewan.<\/p>\n<p>The International Conference on X-ray Microscopy is the principal conference of its community and will bring together experts in the development and use of X-ray microscopes. The conference will address the most recent advances in X-ray microscopy technology and applications th&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt X-ray analytical instrument manufacturer Rigaku Corporation is pleased to announce its attendance at the 14th International Conference on X-ray Microscopy (XRM2018), being held August 19-24, 2018 at the University of Saskatchewan. The International Conference on X-ray Microscopy is the principal conference of its community and will bring together experts in the development and use of [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13426"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13426"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13426\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13426"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13426"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13426"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}