{"id":13443,"date":"2018-09-16T16:06:00","date_gmt":"2018-09-16T15:06:00","guid":{"rendered":"https:\/\/iesinspection.com\/zeiss-presents-new-portable-roughness-inspection-solutions-at-imts\/"},"modified":"2018-09-16T16:06:00","modified_gmt":"2018-09-16T15:06:00","slug":"zeiss-presents-new-portable-roughness-inspection-solutions-at-imts","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13443","title":{"rendered":"ZEISS Presents New Portable Roughness Inspection Solutions at IMTS"},"content":{"rendered":"<p>#ndt ZEISS Industrial Metrology will introduce a new line of surface roughness inspection systems, SURFCOM TOUCH, at IMTS (International Manufacturing Technology Show) in Chicago, September 10-15. An entry-level portable model with three small tracing drivers handles measurements with different attributes, offering a large touch screen for easy operation. For surface and roughness measurements in one portable, compact system, the SURFCOM 50 is ideal. ZEISS also offers a desktop SURFCOM 550 system for high accura&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt ZEISS Industrial Metrology will introduce a new line of surface roughness inspection systems, SURFCOM TOUCH, at IMTS (International Manufacturing Technology Show) in Chicago, September 10-15. An entry-level portable model with three small tracing drivers handles measurements with different attributes, offering a large touch screen for easy operation. For surface and roughness measurements in one portable, [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13443"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13443"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13443\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13443"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13443"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13443"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}