{"id":13450,"date":"2018-09-26T20:06:00","date_gmt":"2018-09-26T19:06:00","guid":{"rendered":"https:\/\/iesinspection.com\/deepvision-to-show-industrial-image-processing-artificial-intelligence-solution-at-ces-2018\/"},"modified":"2018-09-26T20:06:00","modified_gmt":"2018-09-26T19:06:00","slug":"deepvision-to-show-industrial-image-processing-artificial-intelligence-solution-at-ces-2018","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13450","title":{"rendered":"DeepVision to Show Industrial Image Processing Artificial Intelligence Solution at CES 2018"},"content":{"rendered":"<p>#ndt Founded by two Stanford PhDs to develop deep learning solutions and enable adoption of AI at the edge, DeepVision will be demonstrating real time facial\/object recognition and fine-grained object localization at CES 2018 in Las Vegas from January 9-12. The company&#8217;s advanced algorithms will be featured in an FPGA-based prototype interoperating with Socionext&#8217;s M10v SoC solution showcasing a new level of inference power\/performance.<\/p>\n<p>DeepVision brings the level of deep learning inference accuracies to the&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt Founded by two Stanford PhDs to develop deep learning solutions and enable adoption of AI at the edge, DeepVision will be demonstrating real time facial\/object recognition and fine-grained object localization at CES 2018 in Las Vegas from January 9-12. The company&#8217;s advanced algorithms will be featured in an FPGA-based prototype interoperating with Socionext&#8217;s M10v SoC [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13450"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13450"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13450\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13450"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13450"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13450"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}