{"id":13532,"date":"2018-12-24T20:55:00","date_gmt":"2018-12-24T20:55:00","guid":{"rendered":"https:\/\/iesinspection.com\/nordson-sonoscan-adds-c-sam-acoustic-micro-imaging-tools\/"},"modified":"2018-12-24T20:55:00","modified_gmt":"2018-12-24T20:55:00","slug":"nordson-sonoscan-adds-c-sam-acoustic-micro-imaging-tools","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13532","title":{"rendered":"Nordson SONOSCAN adds C-SAM\u00ae Acoustic Micro Imaging Tools"},"content":{"rendered":"<p>#ndt To reliably detect, image and analyze defects in electronic components and similar items, it makes sense to employ multiple nondestructive tools and methods. As part of Nordson\u2019s recent acquisition of Sonoscan, a Nordson DAGE X-ray tool was recently added to the C-SAM\u00ae acoustic micro imaging tools at Nordson SONOSCAN. <\/p>\n<p>Customers bring their tough problems to the SonoLab. Are these flip chip and BGA bumps intact and properly bonded? Are there voids in the underfill? Why do the die in these IGBT modules ke&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>#ndt To reliably detect, image and analyze defects in electronic components and similar items, it makes sense to employ multiple nondestructive tools and methods. As part of Nordson\u2019s recent acquisition of Sonoscan, a Nordson DAGE X-ray tool was recently added to the C-SAM\u00ae acoustic micro imaging tools at Nordson SONOSCAN. Customers bring their tough problems to [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13532"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13532"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13532\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13532"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13532"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13532"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}