{"id":13676,"date":"2019-06-04T21:55:00","date_gmt":"2019-06-04T20:55:00","guid":{"rendered":"https:\/\/iesinspection.com\/new-olympus-dsx1000-digital-microscope-offers-advanced-tools-for-faster-failure-analysis\/"},"modified":"2019-06-04T21:55:00","modified_gmt":"2019-06-04T20:55:00","slug":"new-olympus-dsx1000-digital-microscope-offers-advanced-tools-for-faster-failure-analysis","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13676","title":{"rendered":"New Olympus DSX1000 Digital Microscope Offers Advanced Tools for Faster Failure Analysis"},"content":{"rendered":"<p>The new DSX1000 digital microscope combines the quality of renowned Olympus optics with the ease of use of digital technologies. Designed to measure and observe a variety of materials, the microscope offers guaranteed high- and low-magnification accuracy and precision* in a single instrument for users in the electronics, metal, semiconductor, automotive, aerospace and medical device manufacturing industries.<\/p>\n<p>New benefits and features enhance the DSX1000 digital microscope\u2019s performance and measurement ca&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The new DSX1000 digital microscope combines the quality of renowned Olympus optics with the ease of use of digital technologies. Designed to measure and observe a variety of materials, the microscope offers guaranteed high- and low-magnification accuracy and precision* in a single instrument for users in the electronics, metal, semiconductor, automotive, aerospace and medical device manufacturing [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13676"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13676"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13676\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13676"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13676"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13676"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}