{"id":13802,"date":"2019-10-29T01:29:00","date_gmt":"2019-10-29T01:29:00","guid":{"rendered":"https:\/\/iesinspection.com\/nanotronics-presents-novel-methods-for-ai-in-applied-manufacturing\/"},"modified":"2019-10-29T01:29:00","modified_gmt":"2019-10-29T01:29:00","slug":"nanotronics-presents-novel-methods-for-ai-in-applied-manufacturing","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13802","title":{"rendered":"Nanotronics Presents Novel Methods for AI in Applied Manufacturing"},"content":{"rendered":"<p>Nanotronics, the inventor of a platform that combines AI, automation, and sophisticated imaging for industrial inspection, has announced that Vadim Pinskiy, VP of R&amp;D at the Brooklyn-based manufacturing and microscopy company,  presented at the upcoming O\u2019Reilly Artificial Intelligence Conference which took  place in San Jose from Sept. 9 to 12.<\/p>\n<p>Vadim\u2019s session, &#8220;Development and application of advanced AI decision making for manufacturing&#8221; focused on the theory and development of an AI model for robust r&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Nanotronics, the inventor of a platform that combines AI, automation, and sophisticated imaging for industrial inspection, has announced that Vadim Pinskiy, VP of R&amp;D at the Brooklyn-based manufacturing and microscopy company, presented at the upcoming O\u2019Reilly Artificial Intelligence Conference which took place in San Jose from Sept. 9 to 12. Vadim\u2019s session, &#8220;Development and application of [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13802"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13802"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13802\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13802"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13802"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13802"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}