{"id":13926,"date":"2020-03-09T00:47:00","date_gmt":"2020-03-09T00:47:00","guid":{"rendered":"https:\/\/iesinspection.com\/nanotronics-presents-new-offerings-in-photonics\/"},"modified":"2020-03-09T00:47:00","modified_gmt":"2020-03-09T00:47:00","slug":"nanotronics-presents-new-offerings-in-photonics","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13926","title":{"rendered":"Nanotronics Presents New Offerings in Photonics"},"content":{"rendered":"<p>On February 4th, 2020, Nanotronics, the inventor of a platform that combines AI, automation, and sophisticated imaging for industrial inspection, presented two papers at SPIE, the International Society for Optics and Photonics, for Photonics West, held in the Moscone Center.<\/p>\n<p>&#8220;The two works presented at SPIE West represent Nanotronics\u2019 continual drive to combine Artificial Intelligence and Optical measurements,&#8221; says Vadim Pinskiy, Vice President of Research and Software Development at Nanotronics. &#8220;We sh&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>On February 4th, 2020, Nanotronics, the inventor of a platform that combines AI, automation, and sophisticated imaging for industrial inspection, presented two papers at SPIE, the International Society for Optics and Photonics, for Photonics West, held in the Moscone Center. &#8220;The two works presented at SPIE West represent Nanotronics\u2019 continual drive to combine Artificial Intelligence and [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13926"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13926"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13926\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13926"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13926"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13926"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}