{"id":13990,"date":"2020-05-26T22:41:00","date_gmt":"2020-05-26T21:41:00","guid":{"rendered":"https:\/\/iesinspection.com\/vanta-element-s-xrf-analyzer-offers-fast-affordable-light-element-detection\/"},"modified":"2020-05-26T22:41:00","modified_gmt":"2020-05-26T21:41:00","slug":"vanta-element-s-xrf-analyzer-offers-fast-affordable-light-element-detection","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=13990","title":{"rendered":"Vanta Element-S XRF Analyzer Offers Fast, Affordable Light Element Detection"},"content":{"rendered":"<p>WALTHAM, Mass., (May 26, 2020) The new Vanta Element-S handheld X-ray fluorescence (XRF) analyzer delivers fast light element detection at an affordable price, joining a family of cost-effective, entry-level Vanta Element XRF instruments. The S model is equipped with a silicon drift detector (SDD) to analyze light elements like magnesium (Mg), aluminum (Al), silicon (Si), sulfur (S) and phosphorus (P) in alloys.<\/p>\n<p>Ideal for scrap recycling, basic PMI, metal manufacturing and precious metals, the Vanta Ele&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>WALTHAM, Mass., (May 26, 2020) The new Vanta Element-S handheld X-ray fluorescence (XRF) analyzer delivers fast light element detection at an affordable price, joining a family of cost-effective, entry-level Vanta Element XRF instruments. The S model is equipped with a silicon drift detector (SDD) to analyze light elements like magnesium (Mg), aluminum (Al), silicon (Si), sulfur [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13990"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=13990"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/13990\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=13990"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=13990"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=13990"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}