{"id":14022,"date":"2020-06-30T05:06:00","date_gmt":"2020-06-30T04:06:00","guid":{"rendered":"https:\/\/iesinspection.com\/yxlon-to-present-flagship-cheetah-evo-at-china-semicon-2020\/"},"modified":"2020-06-30T05:06:00","modified_gmt":"2020-06-30T04:06:00","slug":"yxlon-to-present-flagship-cheetah-evo-at-china-semicon-2020","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14022","title":{"rendered":"YXLON to Present Flagship Cheetah EVO at China SEMICON 2020"},"content":{"rendered":"<p>YXLON International, the world\u2019s leading provider of industrial x-ray and CT inspection systems, is looking forward to the SEMICON China 2020 at the Shanghai New International Expo Center. They will proudly present their flagship product for the semiconductor industry &#8211; a Cheetah EVO system, specifically designed for the inspection and analysis of smallest assemblies in consumer electronics, electric vehicles, computer chips, and many more.<\/p>\n<p>Visitors are invited to bring their test samples for a detailed&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>YXLON International, the world\u2019s leading provider of industrial x-ray and CT inspection systems, is looking forward to the SEMICON China 2020 at the Shanghai New International Expo Center. They will proudly present their flagship product for the semiconductor industry &#8211; a Cheetah EVO system, specifically designed for the inspection and analysis of smallest assemblies in consumer [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14022"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14022"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14022\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14022"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14022"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14022"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}