{"id":14128,"date":"2020-11-18T02:35:00","date_gmt":"2020-11-18T02:35:00","guid":{"rendered":"https:\/\/iesinspection.com\/advanced-analysis-software-maximizes-omniscan-users-weld-analysis-capabilities\/"},"modified":"2020-11-18T02:35:00","modified_gmt":"2020-11-18T02:35:00","slug":"advanced-analysis-software-maximizes-omniscan-users-weld-analysis-capabilities","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14128","title":{"rendered":"Advanced Analysis Software Maximizes OmniScan&#x2122; Users\u2019 Weld Analysis Capabilities"},"content":{"rendered":"<p>Olympus\u2019 release of its WeldSight&#x2122; companion PC software for the OmniScan&#x2122; X3 phased array flaw detector provides inspectors with powerful tools to push the boundaries of flaw characterization and sizing. Compatible with conventional UT, phased array (PA) and time-of-flight diffraction (TOFD) acquired data, the software enables inspectors to perform thorough post-inspection analyses that comply with strict validation requirements of international standards.<\/p>\n<p>Optimized Analysis Tools for Complex Weld Inspe&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Olympus\u2019 release of its WeldSight&#x2122; companion PC software for the OmniScan&#x2122; X3 phased array flaw detector provides inspectors with powerful tools to push the boundaries of flaw characterization and sizing. Compatible with conventional UT, phased array (PA) and time-of-flight diffraction (TOFD) acquired data, the software enables inspectors to perform thorough post-inspection analyses that comply with strict [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14128"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14128"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14128\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14128"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14128"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14128"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}