{"id":14154,"date":"2020-12-25T00:16:00","date_gmt":"2020-12-25T00:16:00","guid":{"rendered":"https:\/\/iesinspection.com\/cmos-competitor-to-ingaas-swir-sensors\/"},"modified":"2020-12-25T00:16:00","modified_gmt":"2020-12-25T00:16:00","slug":"cmos-competitor-to-ingaas-swir-sensors","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14154","title":{"rendered":"CMOS Competitor To InGaAs SWIR Sensors"},"content":{"rendered":"<p>Imec has presented a prototype high-resolution short-wave-infrared (SWIR) image sensor with record small pixel pitch of 1.82 \u00b5m. It is based on a thin-film photodetector that is monolithically integrated on a custom Si-CMOS readout circuit.\n<\/p>\n<p \/>\n<p>\nA fab-compatible process flow paves the way to high-throughput, wafer-level manufacturing. The presented technology largely exceeds the capabilities of today&#8217;s InGaAs-based SWIR imagers in terms of pixel pitch and resolution, with disruptive cost and form factor&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Imec has presented a prototype high-resolution short-wave-infrared (SWIR) image sensor with record small pixel pitch of 1.82 \u00b5m. It is based on a thin-film photodetector that is monolithically integrated on a custom Si-CMOS readout circuit. A fab-compatible process flow paves the way to high-throughput, wafer-level manufacturing. The presented technology largely exceeds the capabilities of today&#8217;s InGaAs-based [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14154"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14154"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14154\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14154"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14154"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14154"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}