{"id":14164,"date":"2021-01-01T06:26:00","date_gmt":"2021-01-01T06:26:00","guid":{"rendered":"https:\/\/iesinspection.com\/imec-develops-thin-film-short-wave-infrared-image-sensor\/"},"modified":"2021-01-01T06:26:00","modified_gmt":"2021-01-01T06:26:00","slug":"imec-develops-thin-film-short-wave-infrared-image-sensor","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14164","title":{"rendered":"Imec Develops Thin-film Short-wave-infrared Image Sensor"},"content":{"rendered":"<p>Imec has developed a prototype high-resolution short-wave-infrared (SWIR) image sensor with a record small pixel pitch of 1.82 \u00b5m.<\/p>\n<p>The sensor is based on a thin-film photodetector that is monolithically integrated on a custom Si-CMOS readout circuit. A fab-compatible process flow paves the way to high-throughput, wafer-level manufacturing.\n<\/p>\n<p \/>\n<p>\nThe technology that imec has presented largely exceeds the capabilities of today&#8217;s InGaAs-based SWIR imagers in terms of pixel pitch and resolution, and offer&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Imec has developed a prototype high-resolution short-wave-infrared (SWIR) image sensor with a record small pixel pitch of 1.82 \u00b5m. The sensor is based on a thin-film photodetector that is monolithically integrated on a custom Si-CMOS readout circuit. A fab-compatible process flow paves the way to high-throughput, wafer-level manufacturing. The technology that imec has presented largely exceeds [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14164"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14164"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14164\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14164"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14164"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14164"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}