{"id":14188,"date":"2021-01-25T10:34:00","date_gmt":"2021-01-25T10:34:00","guid":{"rendered":"https:\/\/iesinspection.com\/nanotronics-unveils-ntelligence4g-ai-software\/"},"modified":"2021-01-25T10:34:00","modified_gmt":"2021-01-25T10:34:00","slug":"nanotronics-unveils-ntelligence4g-ai-software","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14188","title":{"rendered":"Nanotronics Unveils nTelligence4G AI Software"},"content":{"rendered":"<p>Nanotronics, developer of the world\u2019s most advanced robotic industrial microscope that combines AI, automation, and sophisticated imaging for industrial inspection, is announcing the release of its fourth generation of artificial intelligence software, nTelligence&#x2122;.<\/p>\n<p>The new innovations include broad improvements to the nSpec\u00ae platform by adding two new AI models with improved performance and increased flexibility. In addition to Nanotronics\u2019 extensive library of analyzers, nTelligence&#x2122; adds the ability t&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Nanotronics, developer of the world\u2019s most advanced robotic industrial microscope that combines AI, automation, and sophisticated imaging for industrial inspection, is announcing the release of its fourth generation of artificial intelligence software, nTelligence&#x2122;. The new innovations include broad improvements to the nSpec\u00ae platform by adding two new AI models with improved performance and increased flexibility. In [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14188"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14188"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14188\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14188"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14188"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14188"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}