{"id":14267,"date":"2021-05-05T10:05:00","date_gmt":"2021-05-05T09:05:00","guid":{"rendered":"https:\/\/iesinspection.com\/nanotronics-appoints-jodi-shelton-global-semiconductor-alliance-co-founder-and-ceo-to-board-of-advisors\/"},"modified":"2021-05-05T10:05:00","modified_gmt":"2021-05-05T09:05:00","slug":"nanotronics-appoints-jodi-shelton-global-semiconductor-alliance-co-founder-and-ceo-to-board-of-advisors","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14267","title":{"rendered":"Nanotronics Appoints Jodi Shelton, Global Semiconductor Alliance co-founder and CEO, to Board of Advisors"},"content":{"rendered":"<p>Nanotronics, developer of the world\u2019s most advanced robotic industrial microscope that combines AI, automation, and sophisticated imaging for industrial inspection, today announced the appointment of Jodi Shelton to the company\u2019s Advisory Board. Jodi is the co-founder and Chief Executive Officer of the Global Semiconductor Alliance, a not-for-profit trade organization at the center of the semiconductor ecosystem that has helped prepare the industry for the paradigm shifts defining it.<\/p>\n<p>As a key advisor to&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Nanotronics, developer of the world\u2019s most advanced robotic industrial microscope that combines AI, automation, and sophisticated imaging for industrial inspection, today announced the appointment of Jodi Shelton to the company\u2019s Advisory Board. Jodi is the co-founder and Chief Executive Officer of the Global Semiconductor Alliance, a not-for-profit trade organization at the center of the semiconductor ecosystem [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14267"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14267"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14267\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14267"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14267"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14267"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}