{"id":14284,"date":"2021-05-13T02:40:00","date_gmt":"2021-05-13T01:40:00","guid":{"rendered":"https:\/\/iesinspection.com\/schmalz-creative-electron-x-ray-devices-leverage-ai\/"},"modified":"2021-05-13T02:40:00","modified_gmt":"2021-05-13T01:40:00","slug":"schmalz-creative-electron-x-ray-devices-leverage-ai","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14284","title":{"rendered":"Schmalz Creative Electron X-Ray Devices Leverage AI"},"content":{"rendered":"<p>Leading global industrial computer hardware manufacturer and IoT solution provider, OnLogic (www.onlogic.com), has announced that premiere X-ray inspection system manufacturer Creative Electron (www.creativeelectron.com) is integrating OnLogic industrial computers into their X-ray devices, enabling faster, more detailed and more reliable X-ray inspection for a wide range of applications.\n<\/p>\n<p \/>\n<p>\n&#8220;A lack of stability and customization options were the key issues that we were running into with other hardwar&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Leading global industrial computer hardware manufacturer and IoT solution provider, OnLogic (www.onlogic.com), has announced that premiere X-ray inspection system manufacturer Creative Electron (www.creativeelectron.com) is integrating OnLogic industrial computers into their X-ray devices, enabling faster, more detailed and more reliable X-ray inspection for a wide range of applications. &#8220;A lack of stability and customization options were the [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14284"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14284"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14284\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14284"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14284"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14284"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}