{"id":14314,"date":"2021-06-30T03:33:00","date_gmt":"2021-06-30T02:33:00","guid":{"rendered":"https:\/\/iesinspection.com\/shortwave-ir-imager-promises-new-devices\/"},"modified":"2021-06-30T03:33:00","modified_gmt":"2021-06-30T02:33:00","slug":"shortwave-ir-imager-promises-new-devices","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14314","title":{"rendered":"Shortwave-IR Imager Promises New Devices"},"content":{"rendered":"<p>A project at the University of California, San Diego (UCSD) has developed a novel shortwave infrared (SWIR) imaging platform that could be valuable in several diverse applications.\n<\/p>\n<p \/>\n<p>\nSWIR radiation, from around 1000 to 1400 nanometers, typically consists of photons reflected back from an object, rather than emitted by it in the manner of longer-wavelength IR thermal radiation. This can potentially provide a greater degree of contrast in an imaging operation.\n<\/p>\n<p>\nIn addition, SWIR wavelengths pass t&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>A project at the University of California, San Diego (UCSD) has developed a novel shortwave infrared (SWIR) imaging platform that could be valuable in several diverse applications. SWIR radiation, from around 1000 to 1400 nanometers, typically consists of photons reflected back from an object, rather than emitted by it in the manner of longer-wavelength IR thermal [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14314"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14314"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14314\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14314"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14314"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14314"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}