{"id":14332,"date":"2021-07-16T01:35:00","date_gmt":"2021-07-16T00:35:00","guid":{"rendered":"https:\/\/iesinspection.com\/cleanliness-inspection-system-can-now-be-used-as-a-digital-microscope\/"},"modified":"2021-07-16T01:35:00","modified_gmt":"2021-07-16T00:35:00","slug":"cleanliness-inspection-system-can-now-be-used-as-a-digital-microscope","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14332","title":{"rendered":"Cleanliness Inspection System Can Now Be Used as a Digital Microscope"},"content":{"rendered":"<p>The OLYMPUS CIX100 cleanliness inspection system\u2019s latest software update includes a new microscope mode, providing component manufacturers with an all-in-one imaging solution for particle analysis and microscope inspections.<\/p>\n<p>The CIX100 system is a turnkey solution dedicated to technical cleanliness inspection with a guided workflow, analysis tools and integrated industry standards. An optimized autofocus routine and optional overview scan in CIX&#x2122; software version 1.5 speed up the automated analysis, mak&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The OLYMPUS CIX100 cleanliness inspection system\u2019s latest software update includes a new microscope mode, providing component manufacturers with an all-in-one imaging solution for particle analysis and microscope inspections. The CIX100 system is a turnkey solution dedicated to technical cleanliness inspection with a guided workflow, analysis tools and integrated industry standards. An optimized autofocus routine and optional [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14332"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14332"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14332\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14332"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14332"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14332"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}