{"id":14443,"date":"2021-11-27T02:13:00","date_gmt":"2021-11-27T02:13:00","guid":{"rendered":"https:\/\/iesinspection.com\/new-dsx1000-software-adds-powerful-analytical-capabilities-for-fast-efficient-workflows\/"},"modified":"2021-11-27T02:13:00","modified_gmt":"2021-11-27T02:13:00","slug":"new-dsx1000-software-adds-powerful-analytical-capabilities-for-fast-efficient-workflows","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14443","title":{"rendered":"New DSX1000 Software Adds Powerful Analytical Capabilities for Fast, Efficient Workflows"},"content":{"rendered":"<p>The Olympus DSX1000 digital microscope has earned a reputation for exceptional image quality and ease of use. New DSX1000 software adds powerful measurement capabilities and usability upgrades to the digital microscope, making it a faster, more comprehensive inspection solution.<\/p>\n<p>Complex Measurements Made Easy<\/p>\n<p>The DSX1000 digital microscope offers a series of simple-to-use advanced measurement functions that make the system even more powerful. Automatic edge detection is available on in-plane and profi&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The Olympus DSX1000 digital microscope has earned a reputation for exceptional image quality and ease of use. New DSX1000 software adds powerful measurement capabilities and usability upgrades to the digital microscope, making it a faster, more comprehensive inspection solution. Complex Measurements Made Easy The DSX1000 digital microscope offers a series of simple-to-use advanced measurement functions that [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14443"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14443"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14443\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14443"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14443"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14443"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}