{"id":14481,"date":"2022-01-25T09:45:00","date_gmt":"2022-01-25T09:45:00","guid":{"rendered":"https:\/\/iesinspection.com\/nanotronics-unveils-new-nspec-macro-standalone-system\/"},"modified":"2022-01-25T09:45:00","modified_gmt":"2022-01-25T09:45:00","slug":"nanotronics-unveils-new-nspec-macro-standalone-system","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14481","title":{"rendered":"Nanotronics Unveils New nSpec\u00ae Macro Standalone System"},"content":{"rendered":"<p>MUNICH&#8211;(BUSINESS WIRE)&#8211;Nanotronics, developer of nSpec\u00ae, the world\u2019s most advanced robotic microscope for industrial inspection, today unveiled nSpec Macro Standalone at SEMICON Europa, the largest European electronics platform connecting industry leaders across the entire design and manufacturing supply chain.<\/p>\n<p>This latest addition within the nSpec\u00ae portfolio enables automatic capture and analysis of images to detect and quantify defects and features of interest. The small footprint of the device allow&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>MUNICH&#8211;(BUSINESS WIRE)&#8211;Nanotronics, developer of nSpec\u00ae, the world\u2019s most advanced robotic microscope for industrial inspection, today unveiled nSpec Macro Standalone at SEMICON Europa, the largest European electronics platform connecting industry leaders across the entire design and manufacturing supply chain. This latest addition within the nSpec\u00ae portfolio enables automatic capture and analysis of images to detect and quantify [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14481"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14481"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14481\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14481"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14481"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14481"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}