{"id":14742,"date":"2022-12-01T10:41:00","date_gmt":"2022-12-01T10:41:00","guid":{"rendered":"https:\/\/iesinspection.com\/?p=14742"},"modified":"2022-12-01T10:41:00","modified_gmt":"2022-12-01T10:41:00","slug":"quantum-computer-vision-tested-for-defect-detection","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14742","title":{"rendered":"Quantum Computer Vision Tested for Defect Detection"},"content":{"rendered":"<p>Scientists have demonstrated what they believe is the first implementation of quantum computer vision for a quality inspection problem on a manufacturing production line.\n<\/p>\n<p>\nResearchers at Multiverse Computing, which delivers quantum computing solutions, and Ikerlan, a technology transfer centre in Spain, developed a quantum-enhanced kernel method for classification on universal gate-based quantum computers, as well as a quantum classification algorithm on a quantum annealer.\n<\/p>\n<p>\nThe team found that bo&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Scientists have demonstrated what they believe is the first implementation of quantum computer vision for a quality inspection problem on a manufacturing production line. Researchers at Multiverse Computing, which delivers quantum computing solutions, and Ikerlan, a technology transfer centre in Spain, developed a quantum-enhanced kernel method for classification on universal gate-based quantum computers, as well as [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14742"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14742"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14742\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14742"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14742"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14742"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}