{"id":14964,"date":"2024-11-21T05:01:00","date_gmt":"2024-11-21T05:01:00","guid":{"rendered":"https:\/\/iesinspection.com\/?p=14964"},"modified":"2024-11-21T05:01:00","modified_gmt":"2024-11-21T05:01:00","slug":"sony-semiconductor-solutions-to-release-an-industrial-cmos-image-sensor","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=14964","title":{"rendered":"Sony Semiconductor Solutions to Release an Industrial CMOS Image Sensor"},"content":{"rendered":"<p>Sony Semiconductor Solutions to Release an Industrial CMOS Image Sensor<br \/>\nwith Global Shutter for High-Speed Processing and High Pixel Count<br \/>\nOffering an Expanded, High-Precision Product Lineup Supporting Faster Recognition and Inspection<\/p>\n<p>Atsugi, Japan \u2014 Sony Semiconductor Solutions Corporation (SSS) today announced the upcoming release of the IMX925 stacked CMOS image sensor with back-illuminated pixel structure and global shutter. This new product offers 394 fps high-speed processing and a high, 24.55-e&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Sony Semiconductor Solutions to Release an Industrial CMOS Image Sensor with Global Shutter for High-Speed Processing and High Pixel Count Offering an Expanded, High-Precision Product Lineup Supporting Faster Recognition and Inspection Atsugi, Japan \u2014 Sony Semiconductor Solutions Corporation (SSS) today announced the upcoming release of the IMX925 stacked CMOS image sensor with back-illuminated pixel structure and [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14964"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=14964"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/14964\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=14964"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=14964"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=14964"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}