{"id":15102,"date":"2025-06-06T04:44:00","date_gmt":"2025-06-06T03:44:00","guid":{"rendered":"https:\/\/iesinspection.com\/?p=15102"},"modified":"2025-06-06T04:44:00","modified_gmt":"2025-06-06T03:44:00","slug":"quantum-dot-cmos-image-sensor-innovates-with-direct-x-ray-and-swir-imaging","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=15102","title":{"rendered":"Quantum Dot CMOS Image Sensor Innovates with Direct X-Ray and SWIR imaging"},"content":{"rendered":"<p>Swiss technology innovation center CSEM, in collaboration with Dutch deep-tech startup QDI Systems, has developed the world\u2019s first image sensor to directly convert X-rays into electronic signals using quantum dots (QDs) on a CMOS platform. This revolutionary approach enables compact, low-cost, and scalable wide-spectrum imaging\u2014from X-rays through visible to short-wave infrared (SWIR)\u2014with applications ranging from safer medical diagnostics to advanced industrial inspection and intelligent recycling.<\/p>\n<p>DI&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Swiss technology innovation center CSEM, in collaboration with Dutch deep-tech startup QDI Systems, has developed the world\u2019s first image sensor to directly convert X-rays into electronic signals using quantum dots (QDs) on a CMOS platform. This revolutionary approach enables compact, low-cost, and scalable wide-spectrum imaging\u2014from X-rays through visible to short-wave infrared (SWIR)\u2014with applications ranging from safer [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/15102"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=15102"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/15102\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=15102"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=15102"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=15102"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}