{"id":15157,"date":"2025-09-12T14:54:00","date_gmt":"2025-09-12T13:54:00","guid":{"rendered":"https:\/\/iesinspection.com\/?p=15157"},"modified":"2025-09-12T14:54:00","modified_gmt":"2025-09-12T13:54:00","slug":"semiconductor-failure-analysis-machine","status":"publish","type":"post","link":"https:\/\/iesinspection.com\/?p=15157","title":{"rendered":"Semiconductor Failure Analysis Machine"},"content":{"rendered":"<p>The reliability of integrated circuit (IC) packaging largely depends on its mechanical integrity. Structural defects such as poor adhesion, voids, micro-cracks, or delamination may not be immediately visible in electrical performance but can significantly reduce device lifespan and cause premature failure.&#013;<br \/>\nSource: NDT<\/p>\n","protected":false},"excerpt":{"rendered":"<p>The reliability of integrated circuit (IC) packaging largely depends on its mechanical integrity. Structural defects such as poor adhesion, voids, micro-cracks, or delamination may not be immediately visible in electrical performance but can significantly reduce device lifespan and cause premature failure.&#013; Source: NDT<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"false","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[],"tags":[45],"_links":{"self":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/15157"}],"collection":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=15157"}],"version-history":[{"count":0,"href":"https:\/\/iesinspection.com\/index.php?rest_route=\/wp\/v2\/posts\/15157\/revisions"}],"wp:attachment":[{"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=15157"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=15157"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iesinspection.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=15157"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}