Nanotronics, an innovator in AI-enhanced industrial inspection and automation, announced today the issuance of U.S. Patent No. 10,169,852, expanding its Super-Resolution imaging portfolio. This proprietary system identifies and classifies defects at lower resolutions than traditional inspection microscopy, providing faster scan times and enhanced throughput. The use of lower magnifications to identify defects that are traditionally only visible at higher magnifications or with specialized microscopes (e.g.,
Source: NDT