The OLYMPUS CIX100 cleanliness inspection system’s latest software update includes a new microscope mode, providing component manufacturers with an all-in-one imaging solution for particle analysis and microscope inspections.
The CIX100 system is a turnkey solution dedicated to technical cleanliness inspection with a guided workflow, analysis tools and integrated industry standards. An optimized autofocus routine and optional overview scan in CIX™ software version 1.5 speed up the automated analysis, mak
Source: NDT
