ZEISS Offers Greater Flexibility with Optical CMM Inspection
#ndt It is now possible to inspect sensitive, reflective or low-contrast surfaces more quickly than ever before with the ZEISS O-INSPECT multisensor coordinate measuring machine. The new ZEISS DotScan chromatic-confocal white light sensor will be featured on the O-INSPECT CMM at IMTS (International Manufacturing Technology Show), booth E-135502, in Chicago, September 10-15. With this new chromatic-confocal [...]